High Performance EDXRF – NEX CG II

Indirect Excitation EDXRF for Trace Level Sensitivity
Enhanced Elemental Analysis for Industrial Quality Control to Advanced Research Applications

NEX CG II is a multi-element, multi-purpose analyzer that delivers rapid qualitative and quantitative trace elemental analyses and addresses needs across many industries. Non-destructively analyze for elements sodium (Na) through uranium (U) in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

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NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

The Rigaku NEX CG II is a multi-element, multi-purpose analyzer, ideal for measuring ultra-low and trace element concentrations into the percent levels. Especially well-suited for semi-quantitative determination of elemental content in complete unknowns, NEX CG II serves many industries. Applications range from research and development to industrial and in-plant quality assurance. It is easy to use for non-technical operators yet powerful enough for expert use in commercial labs and R&D facilities. Users can achieve the lowest limits of detection and easily manage complex applications like testing agricultural soils, and plant materials, analyzing finished animal feeds, measuring waste oils, environmental monitoring, and many others.

Cartesian Geometry and Polarization for Trace Level Sensitivity

NEX CG II builds on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace level sensitivity. NEX CG II features a unique and improved close-coupled Cartesian Geometry optical kernel that dramatically increases signal-to-noise ratio and delivers enhanced elemental analysis.

Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

NEX CG II achieves this superior analytical power with a 50 kV 50 W end-window palladium-anode X-ray tube, five secondary targets covering the complete elemental range sodium through uranium (Na – U), and a high-throughput large-area silicon drift detector (SDD). This unique optical kernel, combined with Rigaku’s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.

Easy Instrument Control with Advanced Qualitative and Quantitative Analytical Software

NEX CG II is easy to use with QuantEZ®, a powerful PC-based software providing intuitive instrument control with simple menu navigation and a customizable EZ Analysis interface. Users can maximize their time and productivity with simplified routine operations and create their own methods using a simple flow bar wizard.

Advanced qualitative and quantitative analysis is powered by Rigaku’s RPF-SQX Fundamental Parameters (FP) software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This robust integrated software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards. Rigaku’s Scattering FP method automatically estimates the concentration of unmeasurable low atomic number elements (H to F) and provides appropriate corrections.

Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced, significantly lowering the cost of ownership and reducing workload requirements for running routine analyses.

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Since its inception in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku Group of Companies are world leaders in the fields of general X-ray diffraction (XRD), thin film analysis (XRF, XRD and XRR), X-ray fluorescence spectrometry (TXRF, EDXRF and WDXRF), small angle X-ray scattering (SAXS), protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology (TXRF, XRF, XRD and XRR), X-ray sources, computed tomography, nondestructive testing and thermal analysis. With Rigaku's vast understanding of X-ray and its complementary technologies as a foundation, our true strength is seen in an unparalleled willingness to collaborate with customers. By promoting partnerships, dialog, and innovation within the global scientific and industrial communities, Rigaku demonstrates a relentless commitment to providing our client markets with fully integrated solutions. The company and its employees are dedicated to developing and supplying universities, industry, and government labs with the ultimate in customer-focused integrated solutions across a wide variety of disciplines, including structural proteomics, nanoengineering research, general purpose X-ray diffraction (XRD) and spectroscopy (XRF), materials analysis and quality assurance. Whether supplying the tools to create better semiconductor chips, enabling drug discovery, improving production line quality, or exploring the new frontier of nanotechnology, Rigaku products and services lead with innovation. Rigaku employs over 1,100 people worldwide in operations based in Japan, the U.S., Europe and China. We value our people. Our value comes from them. Close collaboration between our users and employees sets the direction and focus of our work, allowing us to address customers' needs and stay close to the market place.


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