CAMECA’s universal SIMS: reference detection sensitivity with high throughput & full automation
The IMS 7f-Auto is the latest version of our successful IMS xf Secondary Ion Mass Spectrometer product line. Designed to deliver ultimate precision elemental and isotopic analyses with increased ease-of-use and productivity, it has been optimized for challenging applications such as glass, metals, ceramics, Si-based, III-V and II-VI devices, bulk materials, thin films… fulfilling industry requirements for efficient device development and process control.
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Key analytical features for solving a wide range of analytical problems
The IMS 7f-Auto offers unparalleled depth profiling capabilities with high depth resolution and high dynamic range. The high transmission mass spectrometer is combined with two reactive, high-density ion sources, O2+ and Cs+, thus providing high sputter rate and excellent detection limits. A unique optical design allows both direct ion microscopy and scanning microprobe imaging.
Improved automation & operation efficiency
The IMS 7f-Auto is equipped with a redesigned, in-line primary column for easier and faster primary beam tuning and optimized primary beam current stability. New automated routines for both primary and secondary column tuning minimize operator related biases and improve ease-of-use. A motorized storage chamber with automated load / unload of sample holders ensures high throughput through analysis chaining and remote operation.
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