Rigaku introduces a new X-ray diffractometer.
The new sixth generation MiniFlex™ X-ray diffractometer is the newest addition to MiniFlex series of benchtop X-ray diffraction (XRD) analyzers from Rigaku, widely used in research fields and in industry. It is a multipurpose analytical instrument that can determine: phase identification and quantification, percent crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.
The MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer. This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation. A variety of X-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex X-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control. The new (Gen 6) MiniFlex X-ray diffractometer system embodies the Rigaku philosophy of “Leading with Innovation” by offering the world’s most advanced benchtop XRD.