Elemental analysis by WD-XRF: A Simplified Approach
Using WDXRF to detect elemental impurities offers a various set of benefits over other used techniques. It eliminates the need to prepare a solution and is more suitable for a manufacture setting.
All quantitative analyses described in the article were performed using a Rigaku ZSX Primus IV sequential WDXRF spectrometer. The unit operates at a maximum power of 4 kilowatts and features an optics-above configuration. More information about elemental analysis by WDXRF is available in the original article, along with an overview of X-ray fluorescence technology, standard and sample preparation procedures, analysis methodology, and detailed results.
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